14 results
High Performance Silicon Drift Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 72-73
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- July 2017
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C-8 Modelling the Response of Silicon X-ray Detectors
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- Journal:
- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 197
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F-13 Advantages and Disadvantages of Bayesian Methods for Obtaining XRF Net Intensities
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- Journal:
- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 20 May 2016, p. 215
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F15 Arrays of large-area silicon drift detectors for advanced analytical techniques
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- Journal:
- Powder Diffraction / Volume 21 / Issue 2 / June 2006
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- 20 May 2016, p. 182
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F-23 Combination of Epma and Micro-Xrf in An Sem—Steps to a Complete Elemental Analysis?
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- Journal:
- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 20 May 2016, p. 180
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F-10 Large Area Silicon Drift Detectors for XRF Applications
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- Journal:
- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 197
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F-15 Novel Silicon Drift Detectors with Enhanced Reliability for Increasing Requirements of Analytical Applications
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- Journal:
- Powder Diffraction / Volume 22 / Issue 2 / June 2007
- Published online by Cambridge University Press:
- 20 May 2016, p. 178
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C04 100 mm2 Silicon Drift Detectors with Discrete First Fet
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
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Trace Element Analysis and Sum Peaks in EDS
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1066-1067
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- July 2012
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Batch Quantitative Analyses of the Plagioclase Feldspars by EDS
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1736-1737
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- July 2012
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Improved EDS Performance at EBSD Geometry
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 398-399
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- July 2011
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Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1192-1193
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- July 2011
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Benefits of Combined Evaluation of EPMA and Micro-XRF Spectra of Same Specimen in Scanning Electron Microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1444-1445
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- August 2007
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High-Resolution X-ray Spectroscopy Close to Room Temperature
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue 6 / December 1998
- Published online by Cambridge University Press:
- 28 July 2005, pp. 622-631
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- December 1998
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